Influence of temperature on microelectronics second system reliability

Influence of temperature on microelectronics second system reliability

by Hakim, Edward B. Lall, Pradeep Pecht, Michael

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Title Statements

  • Full title :Influence of temperature on microelectronics second system reliability / Pradeep Lall ... Michael G. Pecht ... [and] Edward B. Hakim ...

Edition Statements

  • Publication Date:1997.

Publication Statements

  • Publisher(s):CRC Press
  • Place of Publication:Boca Raton
  • Language:eng
  • Publication Date:1997.

Notes

Bibliogr. p. 257-291. Index.

The Physical Object

  • Description:[XX]-307 p. : : illustrations, couv. illustrations en coul. ; : 26 cm

Edition Identifiers

  • ISBN:0849394503, 9780849394508
  • oclc:ocn468775724
  • Dewey Decimal:621.381 046

Subjects

Appareils électroniques -- Fiabilité Microélectronique -- Matériaux Mise sous boîtier (Électronique)

Writers

Hakim, Edward B. Lall, Pradeep Pecht, Michael

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  • Influence of temperature on microelectronics and system reliability

    cop. 1997.
    more →
    Influence of temperature on microelectronics and system reliability

  • Influence of temperature on microelectronics and system reliability

    1997
    more →
    Influence of temperature on microelectronics and system reliability

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